Name of the equipment: Field Emission Scanning Electron Microscope Make & Model: HITACHI, SU6600 I-Stem Registration ID- 3213557 Category of Instrument Characterization Types of Analysis / Testing Characterization Application: It's used to generate high-resolution images of surface topography and chemical composition, enabling analysis of materials, structures, and particles at a microscopic level. Description of Instrument FESEM is an advanced imaging tool used to study surface morphology at the nanoscale.

Book through I-STEM: https://www.istem.gov.in/ Slot Booking Link I-STEM Slot Booking link for External User

Booking available for Internal and External Both Requisition form for Internal External

Faculty In-charge: Dr. Soney Varghese Email ID: soneyva@nitc.ac.in Phone number:  +91-9446792019

Technical Staff: Gaurav Pandey(ST) gauravpandey@nitc.ac.in

Department MSED Office Email ID smseoffice@nitc.ac.in Location Room No. 101, Department of Materials Science and Engineering Lab Phone No 04952286528

Features of the equipment ü Electron gun: Tungsten Schottky emission electron source ü Resolution: 1.2nm/30Kv, 3.0 nm/1Kv ü  Probe current: 1pA~200nA ü Specimen chamber pressure: 10-4Pa (high-vacuum), 10~300Pa (low vacuum)	Unique features/Measurement capabilities, if any
Instrument Technical Description and Major Specifications ü Electron gun: Tungsten Schottky emission electron source ü Resolution: 1.2nm/30Kv, 3.0 nm/1Kv ü  Probe current: 1pA~200nA ü Specimen chamber pressure: 10-4Pa (high-vacuum), 10~300Pa (low vacuum)	Measurement/Sample specifications: ü Specimen Size: Max 150 mm dia.x40 mm H Magnification: 500,000 x

	Internal	External Academic Institutes	National R&D Lab	Industry
SEM Only	100	1000	1000	2500
EDS Only	100	1000	1000	1500
SEM+EDS	200	1500	1500	3000
SEM+EDS               Mapping	200	1500	1500	3000
EDS Map Only	100	1000	1000	2000
Gold Coating		250	250	500